Research Progress of Nondestructive Testing of Fruit Maturity Based on Dielectric Properties

Dielectric property detection technology was introduced，which was developed in recent years and applied to fruit maturity identification and quality monitoring.Basic principles of fruit maturity identification by dielectric properties，measurement technology of dielectric properties，and advantages and disadvantages of each measurement technology were also introduced.Application of parallel plate technology and coaxial probe technology in fruit maturity detection was reviewed.At the same time，existing problems in our country′s research in this field and focus of future research were pointed out.