中国农业机械化科学研究院集团有限公司 主管

北京卓众出版有限公司 主办

马铃薯缺陷电阻成像阵列数据获取方法

Data Acquisition Method of Potato Defect Resistance Imaging Array

  • 摘要: 该文针对目前马铃薯缺陷检测方法费时费力、仪器设备昂贵和涉及强磁场等问题,提出了基于电阻层析成像方法实现对马铃薯缺陷检测,研究了马铃薯缺陷电阻成像物场阵列数据获取方式。该文在对成像物理场建立建模基础上,研究不同电极形状对物场电势、等值线等电学特性的影响,以及激励电极形状、电极覆盖率、激励方式对敏感场电势分布仿真研究。最终确定物场阵列数据获取方式,电极结构优化。

     

    Abstract: In view of current time-consuming and laborious methods of potato defect detection,expensive equipment and high magnetic field,an electrical resistance tomography method to detect potato defects were proposed and data acquisition method of potato defect resistance image field array was studied.Based on modeling of imaging physics,effects of different electrode shapes on the electrical potential characteristics of object field and isoline,as well as the simulation of shape of excitation electrode,electrode coverage and excitation mode were studied.Finally,the data acquisition mode of object field array was determined,and electrode structure was optimized.

     

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